Centerless round bronze bar for probe pins used in semiconductor testing.
Supports manufacturing with precision of +0, -0.005mm (5μm) in outer diameter grinding processing. Centerless finishing of free-cutting phosphor bronze round bars.
Contact probes are fine contact components used to evaluate the electrical performance (conductivity, current, functionality, aging, etc.) of chips and wafers. They are essential for quality assurance before product shipment and for the early detection of defects, and their measurement accuracy and contact stability are directly linked to product yield and quality. Recently, with the miniaturization and high integration of semiconductors, there is a demand for even higher performance in probes. Specifically, this involves fine pitch and miniaturization. Stable material precision is essential, especially for fine and high-precision machining. By finishing the outer diameter of free-cutting phosphor bronze round bars, which are cold-drawn materials, it is possible to process them into ultra-high precision materials with an outer diameter tolerance of within 0.005 mm (5 μm). Additionally, high-precision outer diameter grinding typically takes significantly longer than usual. At Shinwa Shoji, we consider this lead time issue as an important procurement method to prevent our customers' production lines from stopping, by combining "manufacturing procurement" and "inventory provision" rather than just material purchasing. We aim to assist in procurement to collaboratively create products with our customers. Please feel free to contact us regarding this matter.
- 企業：伸和商事
- 価格：Other
